# Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides

**A. E. Bence****Arden L. Albee**

CiteWeb id: 20150000050

CiteWeb score: 2306

DOI: 10.1086/627339

Given suitable correction factors, the use of pure oxides and binary oxide phases as standards would make electron microanalysis independent of chemical analyses and problems of sample inhomogeneity. Ziebold and Ogilvie (1964) have shown that the calibration curve in a binary metal alloy system can, within the variance of data points, be described by the linear expression $C_{A}/K_{A} = \alpha_{AB} + (1 - \alpha_{AB})C_{A}$, where $C_{A }$ is the concentration of element A in alloy Ârelative to pure A, and $K_{A}$ is the background-corrected intensity of a characteristic radiation line of A in the alloy relative to that of pure A. This linear variation of the correction factor with composition can be extended to multicomponent systems by using the weighted average of the binary correction factors. Correction factors have been determined empirically for characteristic lines of ten major elements (Na, Mg, Al, Si, K, Ca, Ti, Cr, Mn, and Fe) in the corresponding oxides using phases on binary and pseudobinary ...

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A. E. Bence, Arden L. Albee,

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